Showing posts with label Statistical Process Control. Show all posts
Showing posts with label Statistical Process Control. Show all posts

Monday, April 19, 2010

Measure Cpk only for stable processes

Cpk and other capability indices should be calculated for stable processes only. This is a critical requirement for calculating capability indices. Sadly, it is the most ignored fact in the real world.

What is a stable process?
A process that does not have any special causes present is a stable process. Such a process has inherent variation due to common causes only. The control chart for a stable process has no 'Out of control' points.

Why is stability important for Capability studies?
The capability indices are designed to determine how capable an ongoing process is for consistently delivering product within customer specifications given the natural variation of the process.
Ongoing processes should typically have only common cause variation i.e. the process is statistically stable.
When assignable causes come into play, the process becomes unstable. Now the control chart has out of control points that need to be watched closely and removed as soon as possible.

When processes are unstable, it is recommended to use performance indices like Pp and Ppk.

For more information on capability indices, please read our White Paper Use of different capability indices.

Friday, January 22, 2010

Cp and Cpk are related. Really?

Process capability analysis plays an important role in quality. It helps determine whether the process is capable of consistently producing parts conforming to customer requirements. Cp and Cpk are the two most popular capability indices used to find process capability. Cp and Cpk are related to each other. Whenever I say this most people around me are surprised, some think I am insane. But it is true. Cp and Cpk are related by the equation. Refer to chapter 6 in the NIST/SEMATECH e-handbook of Statistics Handbook

Cpk = (1-k) Cp
where k is the distance between the process mean and the midpoint of specification range.



where
m = midpoint of the specification range or tolerance
mu = process mean
USL and LSL – upper and lower specification limits.

k has a value between 0 and 1.
When k is 0, Cpk is equal to Cp.
When k is less than 1, Cpk < Cp

That is why Cpk ≤ Cp.